Short Description
Xe-Plasma FIB (Tescan Amber X) with field emission scanning electron microscope for a wide range of applications including energy dispersive X-ray spectroscopy and backscattered electron diffraction.
Contact Person
Priv. Doz. DI Dr. Heiko Groiß
Research Services
Investigations and FIB experiments on micro- and nanostructures as part of basic research projects, publicly funded company projects and contract research.
Methods & Expertise for Research Infrastructure
Material characterisation of crystalline (semiconductors to steel) and organic (polymers) materials by SEM imaging, electron diffraction and spectroscopy. Applications for FIB tomography, TEM lamella preparation and material processing in the nanometre range.
Allocation to research infrastructure
For details, please contact the person responsible. Information and contact details can be found on the JKU website at https://www.jku.at/zentrum-fuer-oberflaechen-und-nanoanalytik-zona/