Short Description
The IRIS scanner is an innovative, portable device for large-area simultaneous scanning of art objects using XRF (X-ray fluorescence analysis) and RSI (Reflectance Spectral Imaging in the Vis-NIR-SWIR range).
The device enables non-destructive and non-invasive analyses of flat artworks (paintings, books). The art objects can be analysed at a distance of 1 cm from the device in a vertical or horizontal position. Simultaneous scanning with XRF (Rh tube) and Reflectance Spectral Imaging provide element- and molecule-specific lateral information at the same time, whereby inorganic and organic components used for art objects are captured and visualised by hyperspectral images.
The maximum scanning area is 60 cm x 40 cm at a speed of 42 mm/s. Reflectance Spectral Imaging covers the wavelength range from 400 to 2500 nm.
Contact Person
DI Dr. Dubravka Jembrih-Simbürger
Research Services
The Institute for Natural Sciences and Technology in the Arts (INTK) and the Core Facility "Centre for Material Sciences in Art and Conservation (ZMKK)" are central facilities of the Academy of Fine Arts Vienna for the natural scientific (material) analysis of works of art. The facilities support members of the Academy of Fine Arts Vienna or other research institutions, museums, libraries, archives, etc. in the realisation of joint projects within the framework of research funding or contract research and also offers services (third-party funding) for external parties.
The focus is on scientific material analyses of artworks and archive materials using FTIR, Raman, XRF, UV-Vis, HSI, RSI, ESEM (EDX), Py-GC/MS, digital X-ray radiography and photo documentation (Vis, UV, IR, IRR), microscopy, chambers for accelerated ageing of samples.
Special services on the IRIS scanner (simultaneous XRF & reflectance spectral imaging):
- Non-destructive, non-invasive and simultaneous XRF & RSI scan analyses directly on the art object
- Chemical element analysis using X-ray fluorescence analysis (XRF point analyses or element distribution images) - Pigment characterisation and visualisation of pigment distribution
- Variable X-ray beam diameter: 0.5 mm, 1 mm, 2 mm
- Reflectance Spectral Imaging in the wavelength range of 400 nm - 2500 nm (VIS-NIR-SWIR), molecule-specific information, detection of inorganic/organic materials used in art.
- Suitable for paintings (flat and non-curved surfaces), books, drawings, maps, graphics, etc.
Methods & Expertise for Research Infrastructure
Non-destructive and non-invasive X-ray fluorescence analysis (XRF, Rh tube) and reflectance spectral imaging scan analyses (400 nm - 2500 nm) of works of art (e.g. paintings, books, graphics, drawings, etc.). Simultaneous scanning with XRF & RSI, max. scan area 60 x 40cm2. Pigment, ink and binder characterisation.