Short Description
With the semi-automatic wafer probing station Summit 12K integrated circuits on semiconductor wafers up to 12” can be characterized. Probes are available from DC to 330 GHz. For circuit measurements additional equipment is available, e.g. for power measurements, spectral measurements, and network analysis.
Contact Person
Univ.-Prof. DI Dr. Andreas Stelzer
Research Services
Electrical characterization of integrated circuits in the frequency range from DC to 330 GHz. Two RF-positioner and RF-sources with single-ended and true-differential signal generation, as well as DC-probes for power supply are available. Feasible measurements reach from power measurements to spectral- and network analysis at linear and non-linear as well as frequency transforming devices.
Methods & Expertise for Research Infrastructure
Topics: Microwave measurements, IC-design, Radar sensors;
mm-wave components and subsystems, mm-wave imaging systems