Short Description
The precision ion polishing system (PIPS II) is being used in sample preparation for transmission electron microscopy.
The PIPS II from GATAN is able to thin conventional and cross-section samples with Ar-ions with an accelerating voltage ranging from 0.1 kV to 8 kV down to a thickness of 10 nm.
A built-in high resolution digital optical microscope allows a site specific sample preparation. The sample can be cooled with liquid nitrogen to reduce heat induced artefacts in the sample during the ion bombardment. Furthermore, focused ion beam samples (FIB) can be thinned to the desired thickness.
Contact Person
Prof. Dr. Oliver Diwald
Research Services
Preparation of various sample materials for the transmissions electron microscopy
Methods & Expertise for Research Infrastructure
Preparation of various sample materials for the transmissions electron microscopy
• Conventional samples (metals, ceramics, semiconductors, polymers)
• Cross-section samples
• Post thinning of FIB samples
• Removing artefacts such as amorphous regions and oxide layers
Allocation to research infrastructure
2015-2018
Hüsing, N.; Diwald, O.; Musso, M.; Bourret, G.; Redhammer, G.; Huber, O.; Saage, H.
Interreg Österreich-Bayern 2014- 2020
https://www.interreg-bayaut.net/projekte/liste-der-vorhaben/projektzusammenfassung-ab29
Charge separation within graded metal oxide nanocomposites
2023-2026
Diwald, O.; Bourret, G.
FWF
BioMatTEM
2022-2024
Pokrant S.; Meisner-Kober, N.;Bourret, G.
FFG
E(co)-Forming
2021-2024
Hüsing, N.; Zickler, G.; Österreicher, J.
FFG, LKR, Voestalpine, Infineon, PhysTech, AIT
2018
Johannes A Österreicher, Florian Grabner, Andreas Schiffl, Sabine Schwarz, Gilles R, Bourret
Materials Characterization
https://www.sciencedirect.com/science/article/pii/S1044580317322295
DOI: https://doi.org/10.1016/j.matchar.2018.01.049
Secondary precipitation during homogenization of Al-Mg-Si alloys: Influence on high temperature flow stress
2017
Österreicher J. A., Kumar K., Schiffl A., Schwarz S., Bourret G. R.
Materials Science and Engineering: A
https://www.sciencedirect.com/science/article/pii/S0921509317300990
DOI: https://doi.org/10.1016/j.msea.2017.01.074
Iron Precursor Decomposition in the Magnesium Combustion Flame: A New Approach for the Synthesis of Particulate Metal Oxide Nanocomposites
2017
Gheisi A.R., Niedermaier M., Tippelt G., (...), Bernardi J., Diwald O.
Particle and Particle Systems Characterization; 34(10),1700109
Three-Dimensional Lithography on Si Micro- and Nanowire Arrays
2018
F. J. Wendisch, Michael S. Saller, A. Eadie, A. Reyer, M. Musso, M. Rey, N. Vogel, O. Diwald, and G. Bourret
Nano Letters
https://doi.org/10.1021/acs.nanolett.8b03608
Spatioselective Deposition of Passivating and Electrocatalytic Layers on Si Nanowire Arrays
2020
F. J. Wendisch, M. Abazari, V. Werner, H. Barb, M. Rey, E.S.A. Goerlitzer, N. Vogel, H. Mahdavi, and G. R. Bourret
ACS AMI
https://doi.org/10.1021/acsami.0c14013
Selective Enhancement of Surface and Bulk E-Field within Porous AuRh and AuRu Nanorods
2021
Piaskowski, Alisher Ibragimov, Fedja J. Wendisch and Gilles R. Bourret
J. Phys. Chem. C
https://doi.org/10.1021/acs.jpcc.1c08699
Selective Enhancement of Surface and Bulk E-Field within Porous AuRh and AuRu Nanorods
2021
Piaskowski, Alisher Ibragimov, Fedja J. Wendisch and Gilles R. Bourret
J. Phys. Chem. C
https://doi.org/10.1021/acs.jpcc.1c08699
Rh in the gap: maximizing E-field enhancement within nanorod heterodimers†
2023
Joshua Piaskowski, Georg Haberfehlner, Theresa Bartschmid, Gerald Kothleitner, Martin Steinhart and Gilles R. Bourret
J. Mater. Chem. C
https://pubs.rsc.org/en/content/articlehtml/2023/tc/d3tc00957b
Charge Separation in BaTiO3 Nanocrystals: Spontaneous Polarization Versus Point Defect Chemistry
2023
E Neige, T Schwab, M Musso, T Berger, GR Bourret, O Diwald
Small
https://onlinelibrary.wiley.com/doi/full/10.1002/smll.202206805
e2206805