Short Description
The EasyTom 160 nano-focus X-ray computed tomography system enables the non-destructive materials characterization of biologic samples, polymers and light metal alloys with resolution below 1 micron.
Contact Person
Johann Kastner
Research Services
Cooperations in the field of non-destructive and high-resolution materials characterization.
Methods & Expertise for Research Infrastructure
High-resolution X-ray computed tomography of different inhomogeneous materials with optional in-situ characterization of damage mechansims during tensile testing.
Individual measurements and R&D cooperation projects