Short Description
The Focused Ion Beam (FIB) Helios 5 PFIB CXe offers the possibility of cutting microscopically small samples in the Xe ion beam as well as chemical analyses. The large device is also equipped with an EDX detector for energy dispersive X-ray spectrometry, as well as a time-of-flight mass spectrometer from Tofwerk. The FIB also offers the possibility of analyzing samples in a cooled state (temperatures up to approx. liquid nitrogen temperatures) or cutting them with the ion beam.
Contact Person
Megan Cordill
Research Services
electron microscopy
Methods & Expertise for Research Infrastructure
The Focused Ion Beam (FIB) Helios 5 PFIB CXe offers the possibility of cutting microscopically small samples in the Xe ion beam as well as chemical analyses. The large device is also equipped with an EDX detector for energy dispersive X-ray spectrometry, as well as a time-of-flight mass spectrometer from Tofwerk. The FIB also offers the possibility of analyzing samples in a cooled state (temperatures up to approx. liquid nitrogen temperatures) or cutting them with the ion beam.