Short Description
The LEAP 6000 XR atom probe system is designed for high-resolution 3D imaging and chemical composition analysis at the atomic scale. By combining voltage and laser pulsing, the system enables precise identification of atomic features, including solute clusters, precipitates, dislocations, and grain boundaries, along with their spatial distribution within a material. This advanced technology is widely used in materials science, metallurgy, and semiconductor research.
Contact Person
Dr. Salvatore Bagiante
Research Services
Samples preparation and analysis, introductions
Methods & Expertise for Research Infrastructure
Atom probe tomography including sample preparation (FIB) for material science
Allocation to research infrastructure
Information on terms of use, cooperation, and fees is provided upon request. All such information is defined in a
cooperation agreement.
cooperation agreement.