Short Description
Scanning Electron Microscope (tungsten cathode) with Back Scattered Electrons-, Secondary Electrons- und EDS-detector for manual and automated analysis
Contact Person
Bernd Lederhaas
Research Services
SEM/EDS analysis for manual characterization of non-metallic inclusions and failure/damage study, further services by request
Methods & Expertise for Research Infrastructure
Inclusion characterization: Analysis of the inclusion landscape in semi-finished material and final products or in samples of secondary metallurgy (modification of the inclusion landscape during process) concerning distribution, number, size, content, morphology and chemical composition; manual measurements or automated feature analysis
Failure and damage analysis: Investigation of fractured surfaces and other cases of damage
Primary Metallurgy: Analysis of ores and pellets