ZONA - Zentrum für Oberflächen- und Nanoana­lytik

JKU - Johannes Kepler Universität Linz

Linz | Website

Open for Collaboration

Kurzbeschreibung

Auger electron spectroscopy; X-ray photoelectron spectroscopy; scanning electron; microscopy; focused ion beam microscopy; transmission electron microscopy; spectroscopic ellipsometry in the UV -VIS; spectroscopic ellipsometry in the NIR- MIR-FIR
ion implantation and modification; electrochemical scanning tunneling microscopy; electrochemical atomic force microscopy; Raman spectroscopy; second harmonic generation; optical coherence tomography

Ansprechperson

Univ.-Prof. DI Dr. Kurt Hingerl

Research Services

Nanoanalytics and Surface analytics
material research and material development specifically focused on surface science and nanoanalytics. The listed equipment is used to measure chemical (e.g. composition and charging), electrochemical, topological (e.g. surface steps, roughness), electrical (e.g. conductivity), optical (e.g. dielectric functions, luminescence centers) and mechanical properties for different material classes, from metals to semiconductors, polymers and ceramics.

Methoden & Expertise zur Forschungsinfrastruktur

material research and material development specifically focused on surface science and nanoanalytics. The listed equipment is used to measure chemical (e.g. composition and charging), electrochemical, topological (e.g. surface steps, roughness), electrical (e.g. conductivity), optical (e.g. dielectric functions, luminescence centers) and mechanical properties for different material classes, from metals to semiconductors, polymers and ceramics.

Equipment

• REM Zeiss 1540XB-Cross und Doppelanlage (FIBREM)
• Spektros­ko­pi­sches Ellip­so­meter (FIR, IR, NIR, VIS, UV)
• XPS-Gerät Theta Probe
• Scanning Augerelektronenspektroskopie
• Lab RAM Aramis VIS
• JEOL JEM-2011 FasTEM
• JEOL JEM-2200FS
• Plasmaanlage Tetra 30
• XPS System
• Rasterelektronenmikroskop mit Xe-Ionenfeinstrahl + Softwareerweiterung MapSweeper