Short Description
Advanced surface, layer, and nanoanalysis for research, development, and material testing – methods for micro, nano, and 3D characterization.
Research Services
We offer a comprehensive range of high-precision techniques for surface analysis, nanoanalytics, material testing, and thin-film characterization.
Our laboratory is equipped with state-of-the-art tools including atomic force microscopy (AFM), scanning electron microscopy (SEM), FTIR and UV-Vis spectroscopy, ellipsometry, tribometry, and advanced electrical measurement systems.
Whether you work in research, development, or quality assurance, our analytical capabilities provide detailed insights into surface topography, composition, layer thickness, wettability, mechanical properties, and more. This enables reliable material assessment for applications in microtechnology, optoelectronics, medical devices, sensors, and photonics.
Methods & Expertise for Research Infrastructure
Advanced surface, layer, and nanoanalysis for research, development, and material testing – methods for micro, nano, and 3D characterization.
Topography
- Atomic Force Microscopy (AFM)
- Optical Profilometry
- Scanning Electron Microscopy: SEM
- Surface Profilometry
Electrical
- Enhanced Atomic Force Microscopy (KPFM, PFM)
- Impedance Spectroscopy
- 4 Point Probe Measurement
Mechanical
- Enhanced Atomic Force Microscopy
- Micro Scratch Testing
- Tensile Testing
- Microindentation
- Pin-on-Disk / Ball-on-Disk Tribometer
Chemical
- X-Ray Photoelectron Spectroscopy (XPS) and UV Photoelectron Spectroscopy
- FTIR Spectroscopy
- SEM with Energy Dispersive X-Ray Spectroscopy Detector (EDS)
- Fluorescence Microscopy
Cross section
- Ultramicrotomy
- Waveguide Polishing
- Atomic Force Microscopy (AFM)
- Embedding and Polishing
- Scanning Electron Microscopy (SEM)
Optical
- Ellipsometry
- Integrating Sphere, Luminance and Colorimetry Camera
- Fluorescence Microscopy
- 3D Surface Scanning