Short Description
Variable angle of incidence spectroscopic elipsometer VASE (NIR-VIS-UV:190-1650nm; IR:300-7500cm-1)
Contact Person
Univ.-Prof. DI Dr. Kurt Hingerl
Research Services
Materialanalytic in the framework of scientific cooperation projects with research institutions and industry
Methods & Expertise for Research Infrastructure
Spectroscopic Ellipsometry is used for the determination of thin film and surface optical properties with monolayer sensitivity (surface physics/analytics).
Allocation to research infrastructure
For details please contact the responsible scientist. JKU website http://www.jku.at/zona/
voestalpine
EVG
TU Wien
EVG
TU Wien